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Reveal the Unseen

What to do when your light microscope reaches its limits? Find out more in our new REM brochure.

Scanning electron microscopy is used for precise analyses of the microstructure of components and is characterized by a high depth of field and razor-sharp resolution of the smallest structures. Learn more now - download the brochure here.

Carl Zeiss A/S
Bregnerødvej 133A, 1. sal
3460 Birkerød
Rudersdal Kommune
Danmark
CVR nummer: DK84786217
P nummer: 1002703834

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